EMI测试报告1000BASE

10Mar2014TestReportfor1000BaseTPage1of26(HistogramMethod)(TIEMethod)(TIEMethod)(HistogramMethod)(HistogramMethod)1.4ns0.3nsJitterMasterUnfiltered(NOTX_TCLKACCESS)(NOTX_TCLKACCESS)JitterMasterFiltered1.4ns1.4ns1.4ns1.4ns0.3ns73.1%73.1%2%2%1%670mVto820mV670mVto820mVFitthetemplateFitthetemplateFitthetemplateFitthetemplateFitthetemplateFitthetemplateJitterSlaveUnfilteredJitterMasterUnfilteredJitterSlaveFilteredJitterMasterFilteredJitterSlaveUnfilteredJitterMasterUnfilteredDroopPointJDroopPointGPeakVolt%DiffDPeakVolt%DiffC%DiffAandBPeakVoltPointBPeakVoltPointATemplateTestPointHTemplateTestPointFTemplateTestPointDTemplateTestPointBTemplateTestPointCTemplateTestPointAResultMeasuredValueSpec.RangeTESTTime:15:13:35TestReportfor1000BaseTDeviceID:DeviceDescription:DevicePairID:PortID:NotAvailable793.2mV784.8mV1.08%Fail0.97%PassPassPass0.49%PassNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableApplicationVersion:3.1.4Build8NotAvailableNotAvailableNotAvailableNotAvailablePassPassPassPassPassPass10Mar2014TestReportfor1000BaseTPage2of26Voltage(TIEMethod)(HistogramMethod)(NOTX_TCLKACCESS)(TIEMethod)0.4ns1.4ns1.4nsJitterSlaveUnfilteredJitterSlaveUnfilteredJitterSlaveFiltered(NOTX_TCLKACCESS)(NOTX_TCLKACCESS)(NOTX_TCLKACCESS)1.4nsJitterMasterUnfilteredNotAvailableNotAvailableNotAvailableNotAvailableNotAvailable50mV10mVTransmitterDistortionCommon-modeoutputReturnLossResultMeasuredValueSpec.RangeTESTNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailableNotAvailable10Mar2014TestReportfor1000BaseTPage3of26IEEEStd802.3ab,Sec40.6.1.2.3:1000Base-TDifferentialoutputtemplatepointASpecRange:FitthetemplateTemplatePointATestResult:PassIEEEStd802.3ab,Sec40.6.1.2.3:1000Base-TDifferentialoutputtemplatepointBSpecRange:FitthetemplateTemplatePointBTestResult:Pass10Mar2014TestReportfor1000BaseTPage4of26IEEEStd802.3ab,Sec40.6.1.2.3:1000Base-TDifferentialoutputtemplatepointCSpecRange:FitthetemplateTemplatePointCTestResult:PassIEEEStd802.3ab,Sec40.6.1.2.3:1000Base-TDifferentialoutputtemplatepointDSpecRange:FitthetemplateTemplatePointDTestResult:Pass10Mar2014TestReportfor1000BaseTPage5of26IEEEStd802.3ab,Sec40.6.1.2.3:1000Base-TDifferentialoutputtemplatepointFSpecRange:FitthetemplateTemplatePointFTestResult:PassIEEEStd802.3ab,Sec40.6.1.2.3:1000Base-TDifferentialoutputtemplatepointHSpecRange:FitthetemplateTemplatePointHTestResult:Pass10Mar2014TestReportfor1000BaseTPage6of26IEEEStd802.3ab,Sec40.6.1.2.2::1000Base-TPeakdifferentialoutputvoltagepointASpecRange:MagnitudeofthevoltageatpointAshouldlieintherange670mVto820mVPointAPeakVolt:793.2mVPointAPeakVoltTestResult:Pass10Mar2014TestReportfor1000BaseTPage7of26DifferencebetweenthemagnitudesofthevoltagesatpointsAandB1%.IEEEStd802.3ab,Sec40.6.1.2.2:1000Base-TPeakdifferentialoutputvoltagepointBSpecRange:MagnitudeofthevoltageatpointBshouldlieintherange670mVto820mV.PointBPeakVolt:784.8mVPointBPeakVoltTestResult:Pass%DiffAandB:1.08%PointAPeakVolt:793.2mV%DiffAandB:TestResult:Fail10Mar2014TestReportfor1000BaseTPage8of26IEEEStd802.3ab,Sec40.6.1.2.2:1000Base-TPeakdifferentialoutputvoltagepointCSpecRange:DifferencebetweenthemagnitudeofthevoltageatpointDand0.5timestheaverageofthePeakVoltPointAPeak:793.2mVPeakVoltPointBPeak:784.8mVPeakVoltPointCPeak:398.4mVPeakVolt%DiffC:0.97%PeakVoltPointCTestResult:Pass10Mar2014TestReportfor1000BaseTPage9of26averageofthevoltagemagnitudesatpointsAandB2%IEEEStd802.3ab,Sec40.6.1.2.2:1000Base-TPeakdifferentialoutputvoltagepointDSpecRange:DifferencebetweenthemagnitudeofthevoltageatpointDand0.5timesthePointAPeakVolt:793.2mVPointBPeakVolt:784.8mVPointDPeakVolt:396.4mVPeakVolt%DiffD:0.49%PointDPeakVoltTestResult:Pass10Mar2014TestReportfor1000BaseTPage10of26Limit:RatioofthevoltageatpointGtothevoltageatpointF.IEEEStd802.3ab,Sec40.6.1.2.2:1000Base-TMaximumoutputdrooppointGSpecRange:RatioofthevoltageatpointGtothevoltageatpointF73.1%.DroopPointGPeak:NotAvailableDroopPointFPeak:NotAvailableDroopPointGLimit:NotAvailableDroopPointGTestResult:NotAvailableNotAvailable10Mar2014TestReportfor1000BaseTPage11of26Limit:RatioofthevoltageatpointJtothevoltageatpointH.IEEEStd802.3ab,Sec40.6.1.2.2:1000Base-TMaximumoutputdrooppointJSpecRange:RatioofthevoltageatpointJtothevoltageatpointH73.1%.DroopPointHPeak:NotAvailableDroopPointJPeak:NotAvailableDroopPointJLimit:NotAvailableDroopPointJTestResult:NotAvailableNotAvailable10Mar2014TestReportfor1000BaseTPage12of26+JTxofData0.3nsTrendPlot:MasterJtx_OutTrendPlot:MasterFilteredPk-PkJitterSpecRange:Peak-to-peakvalueoftheMASTERTX_TCLKfilteredjitterIEEEStd802.3ab,Sec40.6.1.2.5:1000Base-TMasterFilteredJitterMasterFilteredPk-PkJitterTestResult:NotAvailableMasterFilteredPk-PkJitter:NotAvailableMasterJtx_Out:NotAvailableMasterFilteredPk-PkJitter+MasterJtx_Out:NotAvailableMasterFilteredClkEdges:NotAvailableNotAvailableNotAvailable10Mar2014TestReportfor1000BaseTPage13of26unjitteredref